Produkt
KlappentextGADEST 2007
Selected, peer reviewed papers from Gettering and Defect Engineering in Semiconductor Technology - GADEST 2007" held from 14th to 19th October 2007 in Italy at the EMFCSC
Selected, peer reviewed papers from Gettering and Defect Engineering in Semiconductor Technology - GADEST 2007" held from 14th to 19th October 2007 in Italy at the EMFCSC
Details
Weitere ISBN/GTIN9783038131946
ProduktartE-Book
EinbandartE-Book
FormatPDF
Format Hinweis0 - No protection
Verlag
Erscheinungsjahr2007
Erscheinungsdatum25.10.2007
Seiten648 Seiten
SpracheEnglisch
Artikel-Nr.2604493
Rubriken
Genre9200