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BuchGebunden
394 Seiten
Englisch
Springererschienen am28.05.2009
Filling a gap in the literature, this volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. Key features include current results and new directions.mehr
Verfügbare Formate
BuchGebunden
EUR172,50
E-BookPDF1 - PDF WatermarkE-Book
EUR149,79

Produkt

KlappentextFilling a gap in the literature, this volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. Key features include current results and new directions.
Zusammenfassung
Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed

Many current results and new directions for future research are featured

Contains extensive references to research articles, books, and relevant computer software

May be used as a textbook for a graduate-level seminar on scan statistics
Details
ISBN/GTIN978-0-8176-4748-3
ProduktartBuch
EinbandartGebunden
Verlag
Erscheinungsjahr2009
Erscheinungsdatum28.05.2009
ReiheStatistics for Industry and Technology
Seiten394 Seiten
SpracheEnglisch
Gewicht946 g
IllustrationenXXVIII, 394 p. 40 illus.
Artikel-Nr.11009232

Inhalt/Kritik

Inhaltsverzeichnis
Joseph Naus: Father of the Scan Statistic.- Precedence-Type Tests for the Comparison of Treatments with a Control.- Extreme Value Results for Scan Statistics.- Boundary Crossing Probability Computationsin the Analysis of Scan Statistics.- Approximations for Two-Dimensional Variable Window Scan Statistics.- Applications of Spatial Scan Statistics: A Review.- Extensions of the Scan Statistic for the Detection and Inference of SpatialClusters.- 1-Dependent Stationary Sequences and Applications to Scan Statistics.- Scan Statistics in Genome-Wide Scan for Complex Trait Loci.- On Probabilities for Complex Switching Rules in Sampling Inspection.- Bayesian Network Scan Statistics for Multivariate Pattern Detection.- ULS Scan Statistic for Hotspot Detection with Continuous Gamma Response.- False Discovery Control for Scan Clustering.- Martingale Methods for Patterns and Scan Statistics.- How Can Pattern Statistics Be Useful for DNA Motif Discovery?.- Occurrence of Patterns and Motifs in Random Strings.- Detection of Disease Clustering.mehr
Kritik
From the reviews:
"The area of scan statistics has developed rapidly in recent years. ... provided excellent overviews of the area. ... There are many papers of interest here for the readers of Technometrics. ... This reviewer enjoyed thumbing through the pages of this volume and feels that the editors hope that it will serve as a valuable reference and source for researchers in applied probability and statistics and in many other areas of science and technology is well justified." (H. N. Nagaraja, Technometrics, Vol. 53 (1), February, 2011)mehr

Schlagworte

Autor

Joseph Glaz has been appointed (effective July 1, 2011) as head of the Department of Statistics, University of Connecticut. He has co-authored several books. Glaz is the current editor-in-chief of the following Springer journal: Methodology and Computing in Applied Probability.
Honors and Awards include : election to the Connecticut Academy of Arts and Sciences (2011), elected fellow of the Institute of Mathematical Sciences (2009), AAUP Excellence in Research Award (2006), Abraham Wald Prize in Sequential Analysis (2006), elected fellow of the American Statistical Assoc. (2000), elected member of the International Statistical Institute (1999).
Most importantly, Joe Glaz has worked closely with Joseph Naus, the father of scan statistics, since this area of statistics was conceived around 1999.
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