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Yield and Variability Optimization of Integrated Circuits

BuchKartoniert, Paperback
234 Seiten
Englisch
Springererschienen am02.11.2012
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications.mehr
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Produkt

KlappentextTraditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications.
Details
ISBN/GTIN978-1-4613-5935-7
ProduktartBuch
EinbandartKartoniert, Paperback
Verlag
Erscheinungsjahr2012
Erscheinungsdatum02.11.2012
Seiten234 Seiten
SpracheEnglisch
IllustrationenXVII, 234 p.
Artikel-Nr.28573702

Inhalt/Kritik

Inhaltsverzeichnis
1 Introduction.- 1.1 Design for Quality and Manufacturability.- 1.2 Notation.- 1.3 Interpretation of Basic Concepts.- 1.4 Summary.- 2 Overview of IC Statistical Modeling.- 2.1 Introduction.- 2.2 Process Variations.- 2.3 Environmental Variations.- 2.4 Statistical Macromodeling.- 2.5 Summary.- 3 Design of Experiments.- 3.1 Introduction.- 3.2 Experiment Analysis.- 3.3 Orthogonal Arrays.- 3.4 Main Effect Analysis.- 3.5 Interaction Analysis.- 3.6 Taguchi Experiments.- 3.7 Summary.- 4 Parametric Yield Maximization.- 4.1 Introduction.- 4.2 Yield Estimation.- 4.3 Indirect Yield Improvement.- 4.4 Direct Yield Optimization Methods.- 4.5 Generalized and Orthogonal Array-Based Gradient Methods for Discrete Circuits.- 4.6 Gradient Methods for Integrated Circuits.- 4.7 Examples.- 4.8 Summary.- 5 Variability Minimization and Tuning.- 5.1 Introduction.- 5.2 Principles of Discrete Circuit Variability Minimization.- 5.3 Principles of IC Variability Minimization.- 5.4 Factor Screening.- 5.5 Taguchi´s on-target Design.- 5.6 Two-Stage Design Strategy.- 5.7 Example 4: CMOS Delay Circuit.- 5.8 Example 5: CMOS Clock Driver.- 5.9 Summary.- 6 Worst-Case Measure Reduction.- 6.1 Introduction.- 6.2 The ±? Transistor Modeling.- 6.3 Worst-Case Measure Minimization.- 6.4 Comments on the ±? Model.- 6.5 Creation of Worst-Case Models From the Statistical Model.- 6.6 Summary.- 7 Multi-Objective Circuit Optimization.- 7.1 Introduction.- 7.2 Multiple-Objective Optimization: An Overview.- 7.3 Fuzzy Sets.- 7.4 Multiple-Performance Statistical Optimization.- 7.5 Multiple-Performance Variability Minimization.- 7.6 Summary.- References.mehr