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Advanced Computing in Electron Microscopy

Previously published in hardcover
BuchKartoniert, Paperback
289 Seiten
Englisch
Springererschienen am19.10.20142. Aufl.
Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. The ?rst edition - cluded a CD with computer programs, which is not included in this edition.mehr

Produkt

KlappentextPreface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. The ?rst edition - cluded a CD with computer programs, which is not included in this edition.
ZusammenfassungThis review of numerical computation methods in high resolution conventional and scanning transmission electron microscope images shows how image calculations help separate information from artifact. Updated with instrumental developments and new references.
Details
ISBN/GTIN978-1-4899-9509-4
ProduktartBuch
EinbandartKartoniert, Paperback
Verlag
Erscheinungsjahr2014
Erscheinungsdatum19.10.2014
Auflage2. Aufl.
Seiten289 Seiten
SpracheEnglisch
Gewicht462 g
IllustrationenX, 289 p.
Artikel-Nr.33252123

Inhalt/Kritik

Inhaltsverzeichnis
The Transmission Electron Microscope.- Linear Image Approximations.- Sampling and the Fast Fourier Transform.- Calculation of Images of Thin Specimens.- Theory of Calculation of Images of Thick Specimens.- Multislice Applications and Examples.- The Programs.- Plotting Transfer Functions.- The Fourier Projection Theorem.- Atomic Potentials and Scattering Factors.- Bilinear Interpolation.- 3D Perspective View.mehr
Kritik
From the reviews of the second edition:
"It is thirteen years since the first edition of Advanced Computing in Electron Microscopy by E.J. Kirkland appeared. ... the book contains much guidance in this complex area and the list of references draws attention to many relevant papers that can all too easily be overlooked." (Ultramicroscopy, Vol. 116, 2012)
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