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Theory and Practice of Thermal Transient Testing of Electronic Components

BuchGebunden
385 Seiten
Englisch
Springererschienen am24.01.20231st ed. 2022
This book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today.mehr
Verfügbare Formate
BuchGebunden
EUR117,69
BuchKartoniert, Paperback
EUR85,59
E-BookPDF1 - PDF WatermarkE-Book
EUR85,59

Produkt

KlappentextThis book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today.
Details
ISBN/GTIN978-3-030-86173-5
ProduktartBuch
EinbandartGebunden
Verlag
Erscheinungsjahr2023
Erscheinungsdatum24.01.2023
Auflage1st ed. 2022
Seiten385 Seiten
SpracheEnglisch
IllustrationenIX, 385 p.
Artikel-Nr.49927845

Inhalt/Kritik

Inhaltsverzeichnis
Introduction: the Importance and Motivation.- Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature.- The Use of Thermal Transient Testing.- General Practical Questions and the Flow of Thermal Transient Measurements.- On the Accuracy and Repeatability of Thermal Measurements.mehr

Schlagworte

Autor

Márta Rencz, PhD, is a Professor and former Head of the Department of Electron Devices at the Budapest University of Technology and Economics. Dr. Rencz also holds a Research Director position with Mentor, a Siemens Business. She received her undergraduate and master degrees in electrical engineering and a PhD from the Technical University of Budapest, Hungary, the Doctor of Science degree from The Hungarian Academy of Science, and the Doctor Honoris Causa Degree from the Technical University of Tallinn. Her latest research interests include the thermal investigation of ICs and MEMS, thermal sensors, thermal testing, thermal simulation, multiphysics model generation, and electro-thermal simulation. Dr. Rencz received the Harvey Rosten Award of Excellence for her research results in thermal modelling and the ASME Allan Krauss Thermal Management Medal for her contributions to the scientific and academic world of thermal transient testing, in particular, her work on thermal metrology including thermal test, characterization, and analysis of semiconductor devices and packages. She is Program Committee member for several international conferences and workshops and a guest editor of special issues at leading scientific journals. She has published her theoretical and practical results in more than 350 technical papers.
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Herausgegeben:Rencz, Marta