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E-BookPDF1 - PDF WatermarkE-Book
157 Seiten
Englisch
Springer International Publishingerschienen am15.03.20231st ed. 2022
?This book presents a critical overview of statistical fiber bundle models, including existing models and potential new ones. The authors focus on both the physical and statistical aspects of a specific load-sharing example: the breakdown for circuits of capacitors and related dielectrics. In addition, they investigate some areas of open research.

This book is designed for graduate students and researchers in statistics, materials science, engineering, physics, and related fields, as well as practitioners and technicians in materials science and mechanical engineering.



James U. Gleaton is Professor Emeritus in the Department of Mathematics and Statistics at the University of North Florida.

David Han is Associate Professor of Management Science and Statistics at the University of Texas at San Antonio.

James D. Lynch is Distinguished Professor Emeritus in the Department of Statistics at the University of South Carolina.

Hon Keung Tony Ng is Professor in the Department of Mathematical Sciences at Bentley University.

Fabrizio Ruggeri is Research Director at the Italian National Research Council in Milan.
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EUR117,69
E-BookPDF1 - PDF WatermarkE-Book
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Produkt

Klappentext?This book presents a critical overview of statistical fiber bundle models, including existing models and potential new ones. The authors focus on both the physical and statistical aspects of a specific load-sharing example: the breakdown for circuits of capacitors and related dielectrics. In addition, they investigate some areas of open research.

This book is designed for graduate students and researchers in statistics, materials science, engineering, physics, and related fields, as well as practitioners and technicians in materials science and mechanical engineering.



James U. Gleaton is Professor Emeritus in the Department of Mathematics and Statistics at the University of North Florida.

David Han is Associate Professor of Management Science and Statistics at the University of Texas at San Antonio.

James D. Lynch is Distinguished Professor Emeritus in the Department of Statistics at the University of South Carolina.

Hon Keung Tony Ng is Professor in the Department of Mathematical Sciences at Bentley University.

Fabrizio Ruggeri is Research Director at the Italian National Research Council in Milan.
Details
Weitere ISBN/GTIN9783031147975
ProduktartE-Book
EinbandartE-Book
FormatPDF
Format Hinweis1 - PDF Watermark
FormatE107
Erscheinungsjahr2023
Erscheinungsdatum15.03.2023
Auflage1st ed. 2022
Seiten157 Seiten
SpracheEnglisch
IllustrationenXIII, 157 p. 48 illus., 41 illus. in color.
Artikel-Nr.9678947
Rubriken
Genre9200

Inhalt/Kritik

Inhaltsverzeichnis
1. Introduction and Preliminaries.- 2. Electrical Circuits of Ordinary Capacitors.- 3. Breakdown of Thin-Film Dielectrics.- 4. Cell Models for Dielectrics.- 5. Electrical Breakdown and the Breakdown Formalism.- 6. Statistical Properties of a Load-Sharing Bundle.- 7. Statistical Analysis of Kim and Lee (2004)'s Data.- 8. Circuits of Ordinary Capacitors.- 9. Size Effects Relationships Motivated by the Load-Sharing Cell Model.- 10. Concluding Comments and Future Research Directions.mehr