Produkt
KlappentextIn the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.
ZusammenfassungAn ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
Details
ISBN/GTIN978-0-306-47292-3
ProduktartBuch
EinbandartGebunden
Verlag
Erscheinungsjahr2003
Erscheinungsdatum31.01.2003
Auflage3rd ed.
Seiten689 Seiten
SpracheEnglisch
Gewicht1619 g
IllustrationenXIX, 689 p. With online files/update.
Artikel-Nr.11955296
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