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Helium Ion Microscopy

Principles and Applications
BuchKartoniert, Paperback
64 Seiten
Englisch
Springererschienen am14.09.20132013
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century.mehr
Verfügbare Formate
BuchKartoniert, Paperback
EUR53,49
E-BookPDF1 - PDF WatermarkE-Book
EUR53,49

Produkt

KlappentextHelium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century.
Details
ISBN/GTIN978-1-4614-8659-6
ProduktartBuch
EinbandartKartoniert, Paperback
Verlag
Erscheinungsjahr2013
Erscheinungsdatum14.09.2013
Auflage2013
ReiheSpringerBriefs in Materials
Seiten64 Seiten
SpracheEnglisch
Gewicht138 g
IllustrationenVIII, 64 p. 29 illus., 16 illus. in color.
Artikel-Nr.29465195

Inhalt/Kritik

Inhaltsverzeichnis
Chapter 1: Introduction to Helium Ion Microscopy.- Chapter 2: Microscopy with Ions  - A brief history.- Chapter 3: Operating the Helium Ion Microscope.- Chapter 4: Ion -Solid  Interactions  and Image Formation.- Chapter 5: Charging and  Damage.- Chapter 6: Microanalysis with the HIM.- Chapter 7: Ion Generated Damage.- Chapter 8: Working with other Ion beams.- Chapter 9: Patterning and Nanofabrication.- Conclusion.- Bibliography.- Appendix: iSE Yields,  and IONiSE  parameters for  He+ excitation  of Elements and Compounds.- Index.mehr
Kritik
From the reviews:
"Helium Ion Microscopy, Principles and Applications, is a compact volume of 64 pages, and is useful to anyone wishing fundamental knowledge on this topic. ... There are many features of this book that make it a useful resource for both the beginning and advanced microscopist. ... this book provides a novice researcher an initial resource to determine if this methodology is useful to their particular area and to determine what trade-offs are necessary." (Michael T. Postek, Microscopy and Microanalysis, Vol. 20 (2), 2014)mehr

Schlagworte