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Laboratory Micro-X-Ray Fluorescence Spectroscopy

Instrumentation and Applications
BuchGebunden
356 Seiten
Englisch
Springererschienen am22.05.20142014
Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems.mehr
Verfügbare Formate
BuchGebunden
EUR160,49
BuchKartoniert, Paperback
EUR160,49
E-BookPDF1 - PDF WatermarkE-Book
EUR149,79

Produkt

KlappentextMicro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems.
Zusammenfassung
Gives a description of the main instrumental influences on the analytical performance

Discusses the different quantification models of X-ray measurements considering the special requirements to the analysis of non-homogeneous materials

Supplies an overview of X-ray fluorescence applications with various suggestions for the use of the analytical potential of this method

Includes supplementary material: sn.pub/extras
Details
ISBN/GTIN978-3-319-04863-5
ProduktartBuch
EinbandartGebunden
Verlag
Erscheinungsjahr2014
Erscheinungsdatum22.05.2014
Auflage2014
ReiheSpringer Series in Surface Sciences
Seiten356 Seiten
SpracheEnglisch
Gewicht730 g
IllustrationenXVIII, 356 p. 254 illus., 107 illus. in color.
Artikel-Nr.31073254

Inhalt/Kritik

Inhaltsverzeichnis
XRF-Basics.- Main Components of X-Ray Spectrometers.- Special Requirements for µ-XRF.- Quantification.- Sample Preparation.- Relations to Other Analytical Methods.- Applications.mehr

Schlagworte

Autor

Michael Haschke was born 1948, his schooling was combined with teachings for metalworker. After the study of physics at the TU Dresden which was finished 1974 with PhD he started his career - at first in the Academy of Science of GDR, branch for scientific instrumentation and then in different companies. From the beginning of the 80th he was working in the field of X-Ray analytics. During that time he was responsible for the introduction of energy-dispersive X-Ray spectrometers (EDS) in GDR, for the buildup of the X-Ray product line in Spectro, Kleve including the excitation with polarized radiation, the use of small spectrometers for jewelry analysis and the introduction of poly-capillary based instruments for µ-XRF in Röntgenanalytik Messtechnik GmbH, Taunusstein in close cooperation with EDAX, USA, the use of µ-XRF as an additional excitation source for electron microscopes in IfG, Berlin and finally for the introduction of a complete product line for µ-XRF in Bruker Nano, GmbH, Berlin. This responsibility was realized as deputy-director or product manager in the different companies. He understood the introduction of new instruments as a combination of the development of the instruments with the introduction into the market. Therefore there is a big experience both for instrumentation as well as for application.