Produkt
KlappentextThis book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.
Zusammenfassung
Written by the leading professionals in the field
Highlights the basic physics as well as the technological aspects of the instrument
Presents the relevant theoretical models and the corresponding software packages
Describes real applications of the technique
Includes supplementary material: sn.pub/extras
Written by the leading professionals in the field
Highlights the basic physics as well as the technological aspects of the instrument
Presents the relevant theoretical models and the corresponding software packages
Describes real applications of the technique
Includes supplementary material: sn.pub/extras
Details
ISBN/GTIN978-3-319-41988-6
ProduktartBuch
EinbandartGebunden
Verlag
Erscheinungsjahr2016
Erscheinungsdatum12.10.2016
Auflage1st ed. 2016
Seiten526 Seiten
SpracheEnglisch
Gewicht988 g
IllustrationenXXIII, 526 p. 320 illus., 204 illus. in color.
Artikel-Nr.38291626
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