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Quantum Metrology, Imaging, and Communication

BuchGebunden
273 Seiten
Englisch
Springererschienen am08.12.20161st ed. 2017
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.mehr
Verfügbare Formate
BuchGebunden
EUR101,64
BuchKartoniert, Paperback
EUR160,49
E-BookPDF1 - PDF WatermarkE-Book
EUR149,79

Produkt

KlappentextThis book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Zusammenfassung
Ideal introduction to the basics and applications of quantum optics

Presents and explains new techniques that are driving the field forwards

Author's combined expertise allows a comprehensive coverage of all aspects, experimental and theoretical

Includes supplementary material: sn.pub/extras
Details
ISBN/GTIN978-3-319-46549-4
ProduktartBuch
EinbandartGebunden
Verlag
Erscheinungsjahr2016
Erscheinungsdatum08.12.2016
Auflage1st ed. 2017
Seiten273 Seiten
SpracheEnglisch
Gewicht588 g
IllustrationenXII, 273 p. 105 illus., 68 illus. in color.
Artikel-Nr.15676057

Inhalt/Kritik

Inhaltsverzeichnis
Quantum Optics and Entanglement.- Two-Photon Interference- Aberration and Dispersion Cancelation.- Quantum Metrology.- Polarization Mode Dispersion.- Ghost Imaging and Related Topics.- Quantum Microscopy.- Correlated and Entangled Orbital Angular Momentum.- Quantum Communication and Cryptography.- Appendices A: Review of Optics.- B: Optical Fields in Quantum Mechanics.- C: Optical Effects of Aberration and Turbulence.- D: Phase Matching in Spontaneous Parametric Down Conversion.- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.mehr

Schlagworte

Autor

David Simon. Professor, Stonehill College, Easton MA 02357, USA

Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA

Alexander V. Sergienko, Boston University, Boston MA 02215, USA