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Data Mining and Diagnosing IC Fails

BuchGebunden
Englisch
SPRINGER USerschienen am21.06.20052005
The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part.mehr
Verfügbare Formate
BuchGebunden
EUR106,99
BuchKartoniert, Paperback
EUR113,50
E-BookPDF1 - PDF WatermarkE-Book
EUR96,29

Produkt

KlappentextThe second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part.
Zusammenfassung
Makes various data mining and diagnostic techniques available in one place to professionals

The techniques described in this book are not available in one place, and many are not even available in any book

Presents a new diagnosis technique SLAT -- single location at a time

Includes supplementary material: sn.pub/extras
Details
ISBN/GTIN978-0-387-24993-3
ProduktartBuch
EinbandartGebunden
Erscheinungsjahr2005
Erscheinungsdatum21.06.2005
Auflage2005
SpracheEnglisch
MasseBreite 160 mm, Höhe 241 mm, Dicke 20 mm
Gewicht576 g
Artikel-Nr.11671449

Inhalt/Kritik

Inhaltsverzeichnis
Introduction.- Statistics.- Yield Statistics.- Area Dependence of the Yield.- Statistics of Embedded Object Fails.- Fail Commonalities.- Spatial Patterns.- Test Coverage and Test Fallout.- Logic Diagnosis.- Slat Based Diagnosis.- Data Collection Requirements.- Appendix A. Distribution of IC Fails.- Appendix B. General Yield Model.- Appendix C. Simplified Center-Satellite Model.- Appendix D. Quadrat Analysis.- Appendix E. Cell Fail Probabilities.- Appendix F. Characterization Group.- Appendix G. Component Fail Probabilities.- Appendix H. Yield and Coverage.- Appendix I. Estimating First Fail Probabilities from the Fallout.- Appendix J. Identity of M and S.- References.- Index.mehr